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Ando, Masami; Nozawa, Takashi; Hirose, Takanori; Tanigawa, Hiroyasu; Wakai, Eiichi; Stoller, R. E.*; Myers, J.*
Fusion Science and Technology, 68(3), p.648 - 651, 2015/10
Times Cited Count:4 Percentile:32.95(Nuclear Science & Technology)Pressurized tubes of F82H and B-doped F82H irradiated at 573 and 673 K up to 6dpa have been measured by a laser profilometer. The irradiation creep strain in F82H irradiated at 573 and 673 K was almost linearly dependent on the effective stress level for stresses below 260 MPa and 170 MPa, respectively. The creep strain of BN-F82H was similar to that of F82H IEA at each effective stress level except 294 MPa at 573 K irradiation. For 673 K irradiation, the creep strain of some BN-F82H tubes was larger than that of F82H tubes. It is suggested that a swelling caused in each BN-F82H because small helium babbles might be produced by a reaction of B(n, ) Li.
Jitsukawa, Shiro; Katano, Yoshio; *; F.A.Garner*
Effects of Radiation on Materials, p.1034 - 1050, 1992/00
no abstracts in English
; Katano, Y.; Shiraishi, K.
Journal of Nuclear Science and Technology, 21(9), p.671 - 677, 1984/00
Times Cited Count:14 Percentile:79.2(Nuclear Science & Technology)no abstracts in English